feat(vd960DBN): 脱机事件日志系统 (W25Q32 环形) — 解决重复上线取证

背景: 设备挂平台测试出现重复上线(现场未断电), 无本地日志无法区分设备真复位 vs MQTT 断连重连。iot_handle_suback 每次重连都发 initialize 是重复上线的直接证据, 日志需能区分二者。实现 (V3.6, ROADMAP P1.2 事件流先行): - offlog.c/h: W25Q32 256KB 环形事件日志 (头扇区+63数据扇区, 8064条) - 32B 定长记录: magic/type/len/flags/seq/ts_ms/unix_ts/boot_seq/payload[12] - 8 类事件: BOOT(复位原因)/IOT_CONNECT/READY/DISCONN/RECONN/ EVT_RETRY/GIVEUP/COIL/TIME_ANCHOR/LOG_CLEAR - 掉电恢复: 头扇区写指针锚点 + 上电 seq 连续性扫描 - 编译期断言防 32B padding 回归 - 插桩 (全部主循环上下文, socket 中断内不写 SPI): - main(): offlog_init + RCC_RSTSCKR 复位原因采集/清除 - iot_mqtt_poll(): MQTT 状态沿检测 (CONNECT/READY/DISCONN) - 重连退避/TCP超时/CONNACK拒绝: RECONN/DISCONN(4)/(3) - iot_evt_process/enqueue: EVT_RETRY/GIVEUP/COIL - net_srv.c dev_time_sync: TIME_ANCHOR 时钟同步锚点 - tests/test_offlog.c: gcc 隔离单测 6 例 (mock W25Q32 NOR 语义) 关键坑: ①中断内写SPI阻塞 ②结构体36B padding致环形错乱 ③扇区级覆盖粒度count扣减语义 (均单测抓出) 待办: P1.3 导出命令(log_query/stat/clear) + 快照流 + 复位原因板上验证
2026-08-04 15:04:12 +08:00
parent a5ac54a2bf
commit ac3fb512d5
8 changed files with 836 additions and 0 deletions
@@ -0,0 +1,234 @@
+/**
+ * test_offlog.c — offlog 环形事件日志 gcc 隔离单测
+ *
+ *  编译: gcc -I../BLE/OnlyUpdateApp_Peripheral/APP/include \
+ *             -o test_offlog test_offlog.c
+ *  运行: ./test_offlog
+ *
+ *  Mock: W25Q32 NOR 行为 (写=AND, 擦=0xFF), mstick/dev_time_now 固定值
+ *  覆盖: 全新初始化 / 环形回绕 / 掉电恢复 / 扇区切换 / 清空审计
+ */
+
+#include <stdio.h>
+#include <string.h>
+#include <stdint.h>
+
+/* ============ mock W25Q32 (4MB, NOR 语义) ============ */
+static uint8_t flash[4 * 1024 * 1024];
+
+void SPI_Flash_Erase_Sector(uint32_t sec)
+{
+    memset(flash + sec * 4096, 0xFF, 4096);
+}
+
+void SPI_Flash_Read(uint8_t *buf, uint32_t addr, uint16_t size)
+{
+    memcpy(buf, flash + addr, size);
+}
+
+void SPI_Flash_Write_NoCheck(uint8_t *buf, uint32_t addr, uint16_t size)
+{
+    uint16_t i;
+    for (i = 0; i < size; i++) flash[addr + i] &= buf[i];   /* NOR: 只能 1→0 */
+}
+
+void SPI_Flash_Write(uint8_t *buf, uint32_t addr, uint16_t size)
+{
+    /* 模拟 storage.c 行为: 目标区域非全 FF 则擦整扇区再写 */
+    uint16_t i;
+    int need_erase = 0;
+    for (i = 0; i < size; i++) {
+        if (flash[addr + i] != 0xFF) { need_erase = 1; break; }
+    }
+    if (need_erase) SPI_Flash_Erase_Sector(addr / 4096);
+    SPI_Flash_Write_NoCheck(buf, addr, size);
+}
+
+/* ============ mock 时间 (已同步: >16亿) ============ */
+static uint32_t mock_ms = 0;
+uint32_t mstick(void) { return mock_ms; }
+uint32_t dev_time_now(void) { return 1784768575UL; }
+
+/* ch32v20x 库类型 (单测环境无 SDK) */
+typedef unsigned char u8;
+
+/* ============ 被测模块 (直接包含实现) ============ */
+#include "../BLE/OnlyUpdateApp_Peripheral/APP/offlog.c"
+
+/* ============ 断言 ============ */
+static int failures = 0;
+#define CHECK(cond) do { \
+    if (!(cond)) { printf("FAIL %s:%d  %s\n", __FILE__, __LINE__, #cond); failures++; } \
+} while (0)
+
+static void reset_flash(void)
+{
+    memset(flash, 0xFF, sizeof(flash));
+    mock_ms = 0;
+}
+
+/* 测试1: 全新初始化 → BOOT 事件可读回 */
+static void test_fresh_init(void)
+{
+    OfflogEvt e;
+    uint8_t payload[4] = {0x18, 0, 0, 0};   /* 假复位原因 (大端序写入 payload) */
+
+    reset_flash();
+    offlog_init();
+    CHECK(offlog_boot_seq() == 1);
+    CHECK(offlog_count() == 0);             /* init 不写事件 */
+
+    offlog_boot(0x18000000);                /* bit27+bit24 之类 */
+    CHECK(offlog_count() == 1);
+    CHECK(offlog_read_idx(0, &e) == 0);
+    CHECK(e.magic == OFFLOG_EVT_MAGIC);
+    CHECK(e.type == OFFLOG_EVT_BOOT);
+    CHECK(e.seq == 1);
+    CHECK(e.boot_seq == 1);
+    CHECK(e.flags & OFFLOG_UNIX_VALID_FLAG);
+    CHECK(e.len == 4);
+    CHECK(memcmp(e.payload, payload, 4) == 0);
+    CHECK(offlog_read_idx(1, &e) == -1);    /* 越界 */
+    printf("PASS test_fresh_init\n");
+}
+
+/* 测试2: 环形回绕 — 写满 8064+5 条, count 封顶, 序号单调 */
+static void test_ring_wrap(void)
+{
+    OfflogEvt e;
+    uint32_t i, n = OFFLOG_MAX_RECORDS + 5;
+
+    reset_flash();
+    offlog_init();
+    for (i = 0; i < n; i++) {
+        offlog_evt(OFFLOG_EVT_IOT_RECONN, NULL, 0);
+    }
+    CHECK(offlog_count() == OFFLOG_MAX_RECORDS - OFFLOG_EVT_PER_SECTOR + 5);  /* 8064-128+5 */
+    /* 最新一条是最后写入的, seq 应等于 n (从 1 开始) */
+    CHECK(offlog_read_idx(offlog_count() - 1, &e) == 0);
+    CHECK(e.seq == n);
+    /* 逻辑首: 回绕时整扇区(128条)被擦 + 写回5条 → 最旧 = 129 */
+    CHECK(offlog_read_idx(0, &e) == 0);
+    CHECK(e.seq == n - OFFLOG_MAX_RECORDS + OFFLOG_EVT_PER_SECTOR - 4);
+    printf("PASS test_ring_wrap (seq %lu..%lu, count %u)\n",
+           (unsigned long)(n - OFFLOG_MAX_RECORDS + OFFLOG_EVT_PER_SECTOR - 4),
+           (unsigned long)n, offlog_count());
+}
+
+/* 测试3: 掉电恢复 — 写 10 条后重新 init, boot_seq 递增, seq 连续 */
+static void test_power_loss_recovery(void)
+{
+    OfflogEvt e;
+    uint32_t i;
+
+    reset_flash();
+    offlog_init();
+    for (i = 0; i < 10; i++) {
+        offlog_evt(OFFLOG_EVT_COIL, NULL, 0);
+    }
+    CHECK(offlog_count() == 10);
+
+    /* 模拟掉电重启 (flash 保留, RAM 全失) */
+    offlog_init();
+    CHECK(offlog_boot_seq() == 2);
+    CHECK(offlog_count() == 10);            /* 上电恢复出之前 10 条 */
+
+    offlog_evt(OFFLOG_EVT_IOT_CONNECT, NULL, 0);
+    CHECK(offlog_count() == 11);
+    CHECK(offlog_read_idx(10, &e) == 0);
+    CHECK(e.type == OFFLOG_EVT_IOT_CONNECT);
+    CHECK(e.seq == 11);                     /* seq 跨 boot 连续 */
+    CHECK(e.boot_seq == 2);
+    printf("PASS test_power_loss_recovery\n");
+}
+
+/* 测试4: 扇区切换 — 写满 128 条后头扇区更新, 数据完整 */
+static void test_sector_switch(void)
+{
+    OfflogEvt e;
+    OfflogHead h;
+    uint32_t i;
+
+    reset_flash();
+    offlog_init();
+    for (i = 0; i < 128; i++) {
+        offlog_evt(OFFLOG_EVT_BOOT, NULL, 0);
+    }
+    /* 第 129 条触发扇区切换 */
+    offlog_evt(OFFLOG_EVT_TIME_ANCHOR, NULL, 0);
+    CHECK(offlog_count() == 129);
+
+    SPI_Flash_Read((uint8_t *)&h, OFFLOG_AREA_BASE, sizeof(h));
+    CHECK(h.magic[0] == OFFLOG_HEAD_MAGIC0);
+    CHECK(h.wr_sector == 2);
+    /* 头在扇区切换时刷新: wr_off = 新扇区起点 (尚未写入第 129 条) */
+    CHECK(h.wr_off == OFFLOG_DATA_BASE + 4096);
+
+    CHECK(offlog_read_idx(127, &e) == 0);
+    CHECK(e.type == OFFLOG_EVT_BOOT);
+    CHECK(e.seq == 128);
+    CHECK(offlog_read_idx(128, &e) == 0);
+    CHECK(e.type == OFFLOG_EVT_TIME_ANCHOR);
+    CHECK(e.seq == 129);
+    printf("PASS test_sector_switch\n");
+}
+
+/* 测试5: 清空 — 擦数据区 + LOG_CLEAR 审计 */
+static void test_clear(void)
+{
+    OfflogEvt e;
+    uint32_t i;
+
+    reset_flash();
+    offlog_init();
+    for (i = 0; i < 5; i++) {
+        offlog_evt(OFFLOG_EVT_IOT_READY, NULL, 0);
+    }
+    offlog_clear();
+    CHECK(offlog_count() == 1);             /* 只剩审计 */
+    CHECK(offlog_read_idx(0, &e) == 0);
+    CHECK(e.type == OFFLOG_EVT_LOG_CLEAR);
+    CHECK(e.seq == 6);                      /* seq 不重置 */
+    printf("PASS test_clear\n");
+}
+
+/* 测试6: 掉电恢复跨扇区 — 写到扇区 2 中间掉电 */
+static void test_power_loss_mid_sector(void)
+{
+    OfflogEvt e;
+    uint32_t i;
+
+    reset_flash();
+    offlog_init();
+    for (i = 0; i < 130; i++) {             /* 已跨入扇区 2 */
+        offlog_evt(OFFLOG_EVT_COIL, NULL, 0);
+    }
+    CHECK(offlog_count() == 130);
+
+    offlog_init();                          /* 掉电重启 */
+    CHECK(offlog_boot_seq() == 2);
+    CHECK(offlog_count() == 130);
+
+    offlog_evt(OFFLOG_EVT_IOT_CONNECT, NULL, 0);
+    CHECK(offlog_count() == 131);
+    CHECK(offlog_read_idx(130, &e) == 0);
+    CHECK(e.seq == 131);
+    printf("PASS test_power_loss_mid_sector\n");
+}
+
+int main(void)
+{
+    test_fresh_init();
+    test_ring_wrap();
+    test_power_loss_recovery();
+    test_sector_switch();
+    test_clear();
+    test_power_loss_mid_sector();
+
+    if (failures) {
+        printf("\n%d FAILURE(S)\n", failures);
+        return 1;
+    }
+    printf("\nALL PASS\n");
+    return 0;
+}