wangfq 87c8e01936 test(vd960DBN): SPI写密度模拟实验 + factory写止血 — VDD跌落诊断 ...

- peripheral_main: sim_snap_spi 模拟快照落盘节奏 (20ms 64B页写 + 每64条切扇区擦除+头写)
- cfig_flash: magic不匹配时跳过 factory SPI_Flash_Write, 用内存默认值继续
  (SPI写触发硬件复位死循环止血: 参数区0x00写也崩, RST=0x00000000)
- 诊断修正: CH32V208GBU6 QFN28 无 NRST 引脚, 共线假设作废;
  SPI写/擦除→电流尖峰→VDD跌落→内部POR/PDR(2.4V)复位;
  BLE射频+SPI电流叠加是头号嫌疑

2026-08-13 11:27:08 +08:00

..

include

fix(vd960DBN): 复位原因位定义错位修正 — RST_REASON=0x08000000=PORRSTF

2026-08-12 18:58:16 +08:00

cfig_flash.c

test(vd960DBN): SPI写密度模拟实验 + factory写止血 — VDD跌落诊断

2026-08-13 11:27:08 +08:00

ch32v20x_it.c

refactor(vd960Loop): 算法回退到 DLD154V4B，四通道适配

2026-06-25 16:21:57 +08:00

dbn_ble_srv.c

fix(vd960DBN): init/clear 懒擦修复不断重启 — 34s 全量擦除超 IWDG 4s

2026-08-12 18:31:56 +08:00

iot_mqtt_srv.c

fix(vd960DBN): 启动诊断打印 + snap_flush 无条件挂载

2026-08-12 18:42:40 +08:00

loop_uart_proto.c

proto(V1.05): variation 由 2B无符号 扩展为 3B有符号

2026-07-14 14:47:39 +08:00

net_srv.c

feat(vd960DBN): 脱机事件日志系统 (W25Q32 环形) — 解决重复上线取证

2026-08-04 15:04:12 +08:00

offlog.c

fix(vd960DBN): init/clear 懒擦修复不断重启 — 34s 全量擦除超 IWDG 4s

2026-08-12 18:31:56 +08:00

peripheral_main.c

test(vd960DBN): SPI写密度模拟实验 + factory写止血 — VDD跌落诊断

2026-08-13 11:27:08 +08:00

peripheral.c

debug(vd960DBN): peripheralChar4Notify 内 resp 队列状态实验打印

2026-08-12 14:08:34 +08:00

simple_json.c

refactor: simple_parse_json 修复空指针崩溃和无\0结尾

2026-07-01 08:55:22 +08:00

snapshot.c

fix(vd960DBN): init/clear 懒擦修复不断重启 — 34s 全量擦除超 IWDG 4s

2026-08-12 18:31:56 +08:00

storage.c

test(vd960DBN): 跳过 snap_init 实验 — SPI 序列还原旧固件

2026-08-12 19:34:55 +08:00

system_ch32v20x.c

refactor(vd960Loop): 算法回退到 DLD154V4B，四通道适配

2026-06-25 16:21:57 +08:00

tcp_json_srv.c

feat(vd960DBN): offlog 协议导出命令分发 — log_stat/log_query/log_clear 落地

2026-08-05 08:53:18 +08:00

usart_biz.c

fix(vd960DBN): init/clear 懒擦修复不断重启 — 34s 全量擦除超 IWDG 4s

2026-08-12 18:31:56 +08:00